a premier workshop dedicated to the advancement of test and burn-in socketing and related technologies.
TestConX is the preeminent event for test consumables, test cell integration, and test operations.
The program scope has expanded over its twenty-year history from packaged semiconductor functional / “final” test and burn-in to encompass all practical aspects of electronics testing including validation, advanced packaging testing, system level test, module test, and beyond to finished product test.
Yole Group will be part of the program with:
Lin FU,
Principal Technology & Market Analyst,
Semiconductor Subsystems and Testing
Yole Intelligence part of Yole Group
John WEST,
Senior Division Director,
Semiconductor Subsystems and Testing Division
Yole Intelligence part of Yole Group
Tuesday, March 7
Market Session
8:00am: Evolution of Semiconductor Technologies with New Applications Are Bringing A Bigger Stage for Test Suppliers
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John West
Deputy Director, Manufacturing & Global Supply Chain Business Line
John West is Deputy Director, Manufacturing & Global Supply Chain Business Line at Yole Group.
He has over 20 years of industry experience and a successful track record in various strategy and consulting projects.
John has a Bachelor's degree in Medical Physics from King's College London and an MBA from Cranfield School of Management.
Lin Fu