Pulsar-8000 MRAM Pulse/Measurement System has been qualified by Tier-1 customer

Integral Solutions International (ISI), the manufacturer of wafer-level Magnetic Device testers, is pleased to announce that their PULSAR8000 MRAM Pulse Generation and Measurement System has been qualified for use in Production
by a Tier-1 customer.

For either STT or SOT applications the PULSAR-8000 delivers unmatched performance in devicelevel MRAM measurement capability. Write Pulse widths are user-definable from 500pS to 5mS, far exceeding the range of more expensive pulsing equipment available. Rise/fall pulse timing is 250pS (AC mode), with amplitude control of +/-3V. The combination of low noise and automatic gain control allows for the PULSAR-8000 to measure devices from 500 through 200K ohms.

Following ISI’s mission of providing high-throughput measurement equipment, the PULSAR-8000 complements its Resistance Measurement channel with a new design of their Fast Threshold detector. With this updated Fast Threshold capability the PULSAR-8000 can perform repeated Write/Read measurements at ~4uS cycle rate, ideal for high-repetition measurements such as Error Rate, where the MRAM device switching repeatability must be measured under high repetitions within just a few seconds. This design was recently awarded US Patent #11482295.

The PULSAR-8000 comes standard with dual-channel capability, for testing up to two STT-MRAM devices at a time. Further, these two channels are synchronized, ideal for SOT-MRAM testing where a balancing pulse must be simultaneously applied to the MTJ during SOT Write-Pulse generation. For even higher throughput, instead of just 1 module the PULSAR-8000 can be
ordered with four modules, for testing of up to 8 STT- or 4 SOT-MRAM devices in one touchdown.

The PULSAR-8000 is seamlessly compatible with the entire portfolio of ISI’s Wafer-Test Magnets, including ISI’s 5K, 10K, and 15K Perpendicular Magnets as well as ISI’s 3-Axis Magnet. The PULSAR-8000 is also compatible with either ISI’s WLA3000 or WLA5000 fully-automated Wafer Testers, or can be used on its own as a standalone Pulse/Measurement system.

As ISI’s CEO Henry Patland summarizes, “The PULSAR-8000 is a game-changer for MRAM Device Testing, providing unmatched flexibility and performance. We are pleased that this recent shipment to a Tier-1 customer has been qualified for high-volume MRAM device testing.”