Technology, Process and Cost Comparison

NAND Comparison 2026

Detailed physical data, 3D NAND architecture and process-flow analysis, and cost structure comparison of the latest consumer NAND generations.

SPR26053

Compared with previous NAND reports, this study focuses on the most advanced 3D NAND devices currently found in consumer products. It covers significantly higher layer counts and introduces a detailed analysis of wafer-to-wafer hybrid bonding, which is becoming a key integration step in leading-edge NAND. A major new contribution is the direct comparison between YMTC’s Xtacking 4.0 and Kioxia/Western Digital’s CBA architectures, highlighting how two different CMOS-to-array bonding strategies affect die structure, process complexity, density, and manufacturing cost.

SCOPE

  • Analyzed devices
    • Sk Hynix 321L 4D NAND
    • Micron 276L 3D NAND
    • Samsung 236L V-NAND
    • Kioxia 218L CBA 3D NAND
    • YMTC 294L Xtacking 4.0 3D NAND
  • From module/end system
    • Sk Hynix UFS NAND Flash 256 GB
    • Micron UFS NAND Flash 512 GB
    • Samsung UFS NAND Flash 512 GB
    • Kioxia UFS NAND Flash 256 GB
    • YMTC NAND Flash 512 GB 

PHYSICAL ANALYSIS

  • Detailed photos in optical SEM, STEM views
  • Precise thickness measurements (metal layers/oxide/WL/BL/unit flash cell/decks,…)
  • Package opening
  • Material identification (channel holes, metal layers,…)
  • Fiji analysis
  • Physical Comparison (package, die, decks, channel holes, unit flash cell, Xtacking 4.0 vs CBA))
  • Cost Comparison
     

Type of Analysis

  • SEM View
  • TEM View
  • Floorplan
  • Cross section
  • Delayering
  • Optical View
  • X-ray View

Technology 

  • 3D NAND
  • Xtacking 4.0
  • CBA
  • Staircase
  • Interlayer Connector

MANUFACTURING PROCESS FLOW

  • Recreation of manufacturing process flow (Xtacking 4.0, CBA, CMOS under array, NAND array)
  • Step by step process flow (number of lithography)

Technical analysis

  • Module​
  • Component​
  • Process​
  • Wafer​
  • Material​
  • IP
  • Packaging
     

COST ANALYSIS

  • Supply chain evaluation
  • Simulation of device cost (NAND array, CMOS circuit, hybrid bonding)

Type of Analysis

  • Die cost
  • Yields
  • Package assemble cost
  • Raw wafer cost
  • Wafer Front-End cost
  • Die cost
  • Dicing & Probe test cost
  • Package assemble cost
  • Final test cost
  • Cost Comparison

REPORT'S OBJECTIVES

  • Compare the latest 3D NAND generations found in the market from the main memory manufacturers (SK Hynix, Micron, Samsung, Kioxia and YMTC).
  • Reconstruct how each device is built and highlight the key architectural and material choices.
  • Link physical design, process complexity, lithography, bonding and yield to die cost and cost per GB.
  • Identify which technology delivers the best balance between density, manufacturability and cost.

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