Technology, Process and Cost

TIA die from Huawei 800G

Analysis of the TIA die in the Huawei/Hisilicon 800G CWDM optical transceiver, which features Silicon Germanium Hetero-junction Bipolar Transistor and tungsten pillars.

SPR26060

SCOPE

Analyzed devices
Huawei/Hisilicon TIA die

From module/end system

  • Huawei/Hisilicon OM3877FX200
  • CWDM 800G optical transceiver

 

PHYSICAL ANALYSIS

Gain a comprehensive understanding of the device through advanced optical and SEM analysis, including detailed imaging, thickness measurements, package opening, material identification and light pathway investigation.

Technology

  • SMIC
  • Huawei/Hisilicon SiGe BiCMOS

Type of Analysis

  • SEM View
  • Floorplan
  • Cross section
  • Optical View
  • Infrared View
 

MANUFACTURING PROCESS FLOW

Technical analysis

  • Module​ disassembly
  • Component​
  • Process​
  • Wafer​
  • Material​

 

COST ANALYSIS

Understand the value chain through supply chain evaluation and detailed device cost simulation.

Type of Analysis

  • Die cost
  • Yields
  • Package assemble cost
  • Raw wafer cost
  • Wafer Front-End cost
  • Die cost
  • Dicing & Probe test cost
  • Package assemble cost
  • Final test cost

Report's objectives

  • Analyze the TIA die and its integration in the optical transceiver.
  • Present main functions and technological solutions used in the TIA die. (SiGe HBT transistor, tungsten deep pillar)

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