Tradeshows & Conferences
MOBILE WORLD CONGRESS
the world’s largest and most influential connectivity event
Recognized as the largest and most influential event for the connectivity ecosystem, MWC Barcelona draws key players from the global mobile operator, device manufacturing, technology provider, vendor, content owner, and tech enthusiast communities.
It’s the one time of the year when everyone who’s anyone gathers under a single roof. Tens of thousands of senior executives from top global companies, representatives of international governments, and trailblazing tech businesses converge at MWC Barcelona to make pivotal decisions. During this event, thought leaders evolve into change-makers, new ideas materialize into business deals, and networking results in remarkable connections. It’s the place to gain insights into the direction of the industry, and your business.
Yole Group will be part of the program on Spectricity Workshop with:
Axel Clouet
Technology & Market Analyst, Imaging
Wednesday, February 28th
9am: How smartphones continue to drive innovation in imaging technologies?
Yole Group analysts will attend the event:
Pierre Cambou
Principal Analyst, Global Semiconductors
Cyril Buey
Technology & Market Analyst, Radio Frequency
Aymen Ghorbel
Technology & Market Analyst, Semiconductor Sustrates & Materials
Ihor Pershukov
Technology & Cost Analyst, Radio Frequency
Interested in an onsite meeting with them? Send us your request at sales.emea@yolegroup.com
Axel Clouet, PhD.
Technology & Market Analyst, Imaging
Axel Clouet, PhD. is Technology & Market Analyst, Imaging at Yole Group.
Alex is a member of Imaging & Display team, within the More than Moore activities. He contributes daily to technology & market analyses on various imaging technologies and participates in the production of the relevant Yole Group's products.
Previously, Axel obtained an MSc from Grenoble Institute of Technology (FR) and a Ph.D. from the University of Grenoble (FR) in collaboration with CEA-LETI, where he worked on color and noise aspects in CMOS image sensors. He is the author of various scientific papers and conference presentations.