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a premier workshop dedicated to the advancement of test and burn-in socketing and related technologies.

TestConX is the preeminent event for test consumables, test cell integration, and test operations.

The program scope has expanded over its twenty-year history from packaged semiconductor functional /  “final” test and burn-in to encompass all practical aspects of electronics testing including validation, advanced packaging testing, system level test, module test, and beyond to finished product test.

Yole Group will be part of the program with:

Lin FU circle

Lin FU,
Principal Technology & Market Analyst,
Semiconductor  Subsystems and Testing
Yole Intelligence part of Yole Group

John WEST,
Senior Division Director,

Semiconductor Subsystems and Testing Division
Yole Intelligence part of Yole Group

Tuesday, March 7
Market Session
8:00am: Evolution of Semiconductor Technologies with New Applications Are Bringing A Bigger Stage for Test Suppliers

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