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Short Wave Infra-Red (SWIR) imaging might be adopted by the consumer world in coming years, driven by under-display facial recognition. That could be a paradigm shift for this niche industry.
The Short Wave Infra-Red spectrum includes light with wavelengths from 1µm-3µm. SWIR imaging is currently used in defense, since it images through smoke, dust or fog and allows stealth laser target designation. It is also used in industry for sorting, content inspection and other applications. In 2021, SWIR area cameras were a niche with nearly 11,000 sold worldwide. However, between 2020 and 2021, big names from the consumer imaging industry created hype by announcing development of SWIR imagers. SWIR could replace Near Infrared (NIR) in 3D sensing modules, where SWIR will outperform NIR in range and reliability. Most of all, SWIR would enable better integration of facial recognition modules under displays, allowing smartphone makers to reach the holy grail of 1:1 screen-to-body ratios. Nevertheless, addressing mass markets will require technological disruptions. Defense or industrial systems use InGaAs sensors costing thousands of dollars, far too much for consumer integrators. Emerging technologies like quantum dots could solve this price issue, but reliability and lifetime need improvement. If this SWIR revolution happens, that could be paradigm shift with repercussions for the whole imaging world.
Most SWIR imaging systems will use sensors but also light sources where technological developments will be needed to address new markets. PISEO will give insights into this industry.
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Matthieu VERSTRAETE
Innovation Leader and Electroncis & Software Architect
Matthieu VERSTRAETE is Innovation Leader and Electroncis & Software Architect at PISEO.
Axel Clouet
Technology & Market Analyst, Imaging and Display
Axel Clouet, Ph.D., is a Technology & Market Analyst, Imaging and Display of the Imaging Team within the Photonics and Sensing division of Yole Intelligence, part of Yole Group.
Axel contributes daily to technology & market analyses on various imaging technologies and participates in the production of the relevant reports. Previously, Axel obtained an MSc from Grenoble Institute of Technology (FR) and a Ph.D. from the University of Grenoble (FR) in collaboration with CEA-LETI, where he worked on color and noise aspects in CMOS image sensors. He is the author of various scientific papers and conference presentations.
